000 00502nam a2200181Ia 4500
001 0000001456
005 20241001121049.0
008 240926s9999 xx 000 0 und d
010 _a9834435
020 0 0 _a0849382262
090 0 0 _aTA 410 W65 1998
100 1 0 _aWojnar
_hLeszek
245 1 0 _aImage Analysis
_bApplications in Material Enginnering
_cLeszek Wojnar
260 0 0 _aFlorida, USA
_bCRC Press
_c1998
300 _a245p.
_bill.
_c24 cm
650 0 0 _aImage Analysis
650 0 0 _aMaterial
_xTesting
999 _c1432
_d1432